Double probing frequency non linear junction detector

Description

Double probing frequency non linear junction detector

Double probing frequency non-linear junction detector

The non-linear junction detector LORNET-0836 is the indispensable tool for quick and reliable detection of devices containing semiconductor components. It can be used for counter-surveillance search works in premises (covert transmitters identification), as well as for location of explosive devices outdoors. The DPF (double probing frequency) technology with a patent pending antenna system places it truly apart from the competition.

Main competitive advantages:

•Double probing frequency operation mode gives significant advantages over single frequency NLJD since it is much better to detect small-sized and high-frequency semiconductor objects at high •frequencies whereas the use of low frequencies benefits from improved detection in the wet ground and concrete walls;

•It is possible to operate in one of the frequency ranges and in both of them simultaneously;

•An embedded parabolic antenna with high gain (20 dB at 3600 MHz) enables highly precise detection of semiconductor components from a long distance (up to 10 m);

•Laser pinpointing for a space selective object localization;

•Wide power control range, automatic and manual modes of probing signal level adjustment;

•Possibility to listen to the envelope detector output as well as to the received signal level via a built-in loudspeaker and wireless head phones to evaluate parametric impacts (e.g. knocking) on the suspicious object.